《IEEE電子設(shè)備學(xué)會(huì)雜志》（J-EDS）是一本開(kāi)放的、完全電子化的科學(xué)期刊，出版的論文范圍從基礎(chǔ)研究到應(yīng)用研究，科學(xué)嚴(yán)謹(jǐn)，與電子設(shè)備相關(guān)。J-EDS發(fā)表了有關(guān)電子和離子集成電路器件和互連的理論、建模、設(shè)計(jì)、性能和可靠性的原始和重要貢獻(xiàn)，涉及絕緣體、金屬、有機(jī)材料、微等離子體、半導(dǎo)體、量子效應(yīng)結(jié)構(gòu)、真空器件和具有應(yīng)用于生物電子學(xué)、生物醫(yī)學(xué)電子學(xué)、計(jì)算、通信、顯示、微電子力學(xué)、成像、微驅(qū)動(dòng)器、納米器件、光電子學(xué)、光電學(xué)、功率集成電路和微傳感器。關(guān)于這些主題的教程和評(píng)論論文也已出版。此外，偶爾也會(huì)出版一些特別的期刊，其中有一些關(guān)于更深入和更廣泛的特定領(lǐng)域的論文集。J-EDS出版所有被認(rèn)為是技術(shù)上有效和原創(chuàng)的論文。所有的研究論文都得益于快速的同行評(píng)審和出版，并存放在IEEExplore中。

The IEEE Journal of the Electron Devices Society (J-EDS) is an open-access, fully electronic scientific journal publishing papers ranging from fundamental to applied research that are scientifically rigorous and relevant to electron devices. The J-EDS publishes original and significant contributions relating to the theory, modelling, design, performance, and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanodevices, optoelectronics, photovoltaics, power IC's, and micro-sensors. Tutorial and review papers on these subjects are, also, published. And, occasionally special issues with a collection of papers on particular areas in more depth and breadth are, also, published. J-EDS publishes all papers that are judged to be technically valid and original. All research papers benefit from rapid peer review and publication, and are deposited in IEEE Xplore.